恭賀力神科技獲頒ANQ學會頒贈ARE-QP(ANQ Recognition for Excellence in Quality Practice)獎項殊榮

 2014-08-13

力神科技參加論文發表: 題目: Integrated Dynamic and Static PAT Method Applied in the Semiconductor Packaging and Testing Industry 同時獲得ANQ學會頒贈ARE-QP(ANQ Recognition for Excellence in Quality Practice)獎項殊榮。